Identity Conference this Week in Washington, D.C.

Globally recognized experts on identity management and border control technologies will address critical issues and cutting-edge applications at the connect:ID exhibition and conference March 17-19, 2014 in Washington, D.C.

The conference focuses on identity technology requirements in government and brings together experts from industry, adopters, and government officials to explore the development and fusion of multiple advanced identity technologies -- including biometrics, secure credentials, and digital identity systems.

On Wednesday, March 19, the program will feature "Law enforcement: At the cutting-edge of new identity techniques." Speakers Kris Ranganath (CTO - Biometrics Solutions Division, NEC Corporation of America) will discuss "Cloud technology as an enabler of the next generation Western Identification Network"; Major Sean Jowell (Bureau Commander of the Support Services Bureau, Pinellas County Sheriff's Office) will speak on "Face recognition for rapid law enforcement subject identification"; and Anastatia Pavlovic (Technical Project Manager, Agnitio) will talk about the "Applicability of voice biometrics in law enforcement."

Click here to learn more about the connect:ID conference.

< Prev

Product News

Six interchangeable LED lamps

highlight the features of the OPTIMAX Multi-Lite Forensic Inspection Kit from Spectronics Corporation. This portable kit is designed for crime-scene investigation, gathering evidence, and work in the forensic laboratory. The LEDs provide six single-wavelength light sources, each useful for specific applications, from bodily fluids to fingerprints. The wavelengths are: UV-A (365 nm), blue (450 nm), green (525 nm), amber (590 nm), red (630 nm), and white light (400-700 nm). The cordless flashlight weighs only 15 oz. To learn more, go to: