NIST Short Documentary Wins Award

NIST's short documentary, Detective X: (Re) Discovering Wilmer Souder, received Best Biography Film at the 2018 Tech Doc Fest in Seattle, Washington.

 

The Tech Doc Fest is a film festival that presents the best films that document the history, individuals, organizations, and future of technology. The 2018 festival was held February 1-3, 2018.

You can view the ten-minute NIST documentary here.

 
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New Books

Bloodstain Pattern Analysis

Most forensic disciplines attempt to determine the “who” of a crime. But bloodstain pattern analysis focuses on the “what happened” part of a crime. This book is the third edition of Blood-stain Pattern Analysis. The authors explore the topic in depth, explaining what it is, how it is used, and the practical methodologies that are employed to achieve defensible results. It offers practical, common-sense advice and tips for both novices and professionals. www.crcpress.com

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