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Scanning Electron Microscopy
From Monday, March 06 2017
To Friday, March 10 2017
Every day

 Sponsor: Hooke College of Applied Sciences

Description: The Scanning Electron Microscopy (SEM) course emphasizes hands-on learning. Using the latest SEM and EMA instruments, students have the opportunity to study their own samples, or test samples provided by our staff, under the direction of McCrone scientists with over 60 years of combined SEM/EDS/WDS experience.

During the scanning electron microscopy course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. This SEM training provides a foundation for students new to SEM and EDS. At the end of the SEM workshop, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, we emphasize procedures to better utilize SEM and EDS to solve practical problems. The experience of our instructors allows them to optimize SEM and EDS analysis for a wide range of materials analysis questions.

Location: 850 Pasquinelli Dr, Westmont IL 60559
Contact: Chris Gorman 630-887-7100 This e-mail address is being protected from spam bots, you need JavaScript enabled to view it

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Lifting Latent Fingerprints from Difficult Surfaces

ALMOST ANYONE can find, process, and lift a latent print that happens to be in a logical and obvious place like a door handle, a beer can, or a butcher knife. But sometimes, a latent print is not just sitting there in a logical and obvious place. Sometimes, you have to use your imagination to find the print and your skills to lift it.

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