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Scanning Electron Microscopy
From Monday, March 06 2017
To Friday, March 10 2017
Every day

 Sponsor: Hooke College of Applied Sciences

Description: The Scanning Electron Microscopy (SEM) course emphasizes hands-on learning. Using the latest SEM and EMA instruments, students have the opportunity to study their own samples, or test samples provided by our staff, under the direction of McCrone scientists with over 60 years of combined SEM/EDS/WDS experience.

During the scanning electron microscopy course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. This SEM training provides a foundation for students new to SEM and EDS. At the end of the SEM workshop, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, we emphasize procedures to better utilize SEM and EDS to solve practical problems. The experience of our instructors allows them to optimize SEM and EDS analysis for a wide range of materials analysis questions.

Location: 850 Pasquinelli Dr, Westmont IL 60559
Contact: Chris Gorman 630-887-7100 This e-mail address is being protected from spam bots, you need JavaScript enabled to view it


New Books

Bloodstain Pattern Analysis

Most forensic disciplines attempt to determine the “who” of a crime. But bloodstain pattern analysis focuses on the “what happened” part of a crime. This book is the third edition of Blood-stain Pattern Analysis. The authors explore the topic in depth, explaining what it is, how it is used, and the practical methodologies that are employed to achieve defensible results. It offers practical, common-sense advice and tips for both novices and professionals.