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Scanning Electron Microscopy
From Monday, August 21 2017
To Friday, August 25 2017
Every day

 Sponsor: Hooke College of Applied Sciences

Description: The Scanning Electron Microscopy (SEM) course emphasizes hands-on learning. Using the latest SEM and EMA instruments, students have the opportunity to study their own samples, or test samples provided by our staff, under the direction of McCrone scientists with over 60 years of combined SEM/EDS/WDS experience.

During the scanning electron microscopy course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. This SEM training provides a foundation for students new to SEM and EDS. At the end of the SEM workshop, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, we emphasize procedures to better utilize SEM and EDS to solve practical problems. The experience of our instructors allows them to optimize SEM and EDS analysis for a wide range of materials analysis questions.

Location: 850 Pasquinelli Dr, Westmont IL 60559
Contact: Chris Gorman 630-887-7100 This e-mail address is being protected from spam bots, you need JavaScript enabled to view it

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Recovering Latent Fingerprints from Cadavers

IN A HOMICIDE CASE, the recovery of latent impressions from a body is just one more step that should be taken in the process of completing a thorough search. This article is directed at crime-scene technicians and the supervisors who support and direct evidence-recovery operations both in the field and in the controlled settings of the medical examiner’s office or the morgue under the coroner’s direction.

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