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Scanning Electron Microscopy: Advanced X-Ray Microanalysis by EDS
From Wednesday, October 25 2017
To Friday, October 27 2017
Every day

 Sponsor: Hooke College of Applied Sciences

Description: This Scanning Electron Microscopy (SEM) imaging course is an advanced topics course and provides instruction and hands-on practice for getting the best possible SEM images, especially from difficult samples, or under challenging operating conditions. Signals and image generation, instrument operation, operating variables, image interpretation and applications of SEM will be studied through lectures and hands-on activities. Advanced SEM imaging topics such as very high resolution imaging and low voltage imaging will be covered.

Location: 850 Pasquinelli Dr, Westmont IL 60559
Contact: Chris Gorman 630-887-7100 This e-mail address is being protected from spam bots, you need JavaScript enabled to view it

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Court Case Update

FINGERPRINT EVIDENCE went through a nearly three-year ordeal in the New Hampshire court system, but eventually emerged unscathed. On April 4, 2008, the New Hampshire Supreme Court unanimously reversed the decision of a lower court to exclude expert testimony regarding fingerprint evidence in the case of The State of New Hampshire v. Richard Langill. The case has been remanded back to the Rockingham County Superior Court.

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