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Scanning Electron Microscopy: Advanced X-Ray Microanalysis by EDS
From Wednesday, October 25 2017
To Friday, October 27 2017
Every day

 Sponsor: Hooke College of Applied Sciences

Description: This Scanning Electron Microscopy (SEM) imaging course is an advanced topics course and provides instruction and hands-on practice for getting the best possible SEM images, especially from difficult samples, or under challenging operating conditions. Signals and image generation, instrument operation, operating variables, image interpretation and applications of SEM will be studied through lectures and hands-on activities. Advanced SEM imaging topics such as very high resolution imaging and low voltage imaging will be covered.

Location: 850 Pasquinelli Dr, Westmont IL 60559
Contact: Chris Gorman 630-887-7100 This e-mail address is being protected from spam bots, you need JavaScript enabled to view it


Product News

Six interchangeable LED lamps

highlight the features of the OPTIMAX Multi-Lite Forensic Inspection Kit from Spectronics Corporation. This portable kit is designed for crime-scene investigation, gathering evidence, and work in the forensic laboratory. The LEDs provide six single-wavelength light sources, each useful for specific applications, from bodily fluids to fingerprints. The wavelengths are: UV-A (365 nm), blue (450 nm), green (525 nm), amber (590 nm), red (630 nm), and white light (400-700 nm). The cordless flashlight weighs only 15 oz. To learn more, go to: